Equipment Systems Solutions

CUSTOMISED SOLUTIONS HELP CUSTOMERS CARRY ON

As a leader in Equipment Systems Solutions (ESS), we provide our customers with customised system solutions for mass volume manufacturing …

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Wafer Level Test Solutions

PRODUCT LEADERSHIP TO THE FORE

Acquired by AEM in 2018, Afore is an industry pioneer in delivering MicroElectro-Mechanical-Systems (MEMS) and special wafer probing needs, providing …

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System Level Test

CUSTOMER INTIMACY IS AN SLT-i KEY

The System Level Test and Inspection (SLT-i) Business Unit provides advanced customised solutions to our customers around the world leveraging …

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System Level Test

Test paradigm shift with System Level Test

The Semiconductor Industry Needs Continuous Improved Faults Coverage While Reducing The Overall Cost Of Test Faults coverage is becoming more …

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Wafer Test Solutions

AEM-Afore’s Cryogenic Wafer Prober

Launched in 2018, AEM-Afore’s Cryogenic Wafer Prober, or CWP, is the world’s first 300mm cryogenic probe station. Project manager and …

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