Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
World’s first production probing system with pressure stimulus
World’s first rotating probing system for motion sensors
World’s first 300mm cryogenic probe station
World’s first production probing system with pressure stimulus
Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.
Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.
Our customized solutions enable you to always be a step ahead.
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Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions
Offers a full test solution with Test Systems hardware, software & support.
Offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.
