Wafer Test Solutions

Better test drives better innovation

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

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World’s first production probing system with pressure stimulus

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World’s first rotating probing system for motion sensors

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World’s first 300mm cryogenic probe station

World’s first production probing system with pressure stimulus

Applications​

Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.

Products

Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.

Our customized solutions enable you to always be a step ahead.

For Services

PRODUCTS

Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions

Offers a full test solution with Test Systems hardware, software & support.

Offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.

Our website will undergo scheduled maintenance on Saturday, 10th August 2024. During this time, users may experience intermittent access issues. The maintenance is expected to take approximately one hour, with a brief downtime of 10-15 minutes, during which server access will be unavailable. We appreciate your understanding and patience.