Better test drives better innovation

Afore Wafer Level Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer level and other advanced packages.

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World’s first production probing system with pressure stimulus

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World’s first rotating probing system for motion sensors

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World’s first 300mm cryogenic probe station

Applications

Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.

Products

Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices.

Our customized solutions enable you to always be a step ahead.