Intelligent Thermal Control

High-throughput ABI with Intelligent Thermal Control

As AI processors and high-performance compute devices are manufactured with leading-edge process technology nodes and advanced heterogeneous packages with chiplets, the overall cost of test to provide the highest quality of the final package is increasing significantly.

Leveraging AEM’s decades of experience in automation, thermal management, and application-specific test instruments, we offer customers a scalable solution that reduces test times while increasing overall test coverage, delivering a cost-of-test advantage for its users.

AMPS-BI efficiently performs accelerated high voltage stress testing through the use of its patented advanced multi-zone intelligent thermal control and power management capabilities.

  • Fully automated modular system – Capable of simultaneous high voltage stress testing of hundreds of devices in parallel
     
  • Patented Multi-zone Intelligent Thermal Control (ITC). Scalable to >2KW per device, with precision control for thermal stability during test
     
  • Application-specific test instruments – Optimized for customer requirements to ensure optimal yield
     
  • Individual device test control and instrumentation allow for asynchronous operation, pattern changing on the fly, and high system utilization
     

AMPS-BI is a high-power, high-throughput automated burn-in test system for advanced high-power semiconductor devices.

Discover our Burn-In capabilities today

For more specifications, speak with our experts or download our product brochure

Reimagine your test flows and deploy customized solutions

PRODUCTS

Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions

Offers a full test solution with Test Systems hardware, software & support.

Offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.

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