As AI processors and high-performance compute devices are manufactured with leading-edge process technology nodes and advanced heterogeneous packages with chiplets, the overall cost of test to provide the highest quality of the final package is increasing significantly.
Leveraging AEM’s decades of experience in automation, thermal management, and application-specific test instruments, we offer customers a scalable solution that reduces test times while increasing overall test coverage, delivering a cost-of-test advantage for its users.
AMPS-BI efficiently performs accelerated high voltage stress testing through the use of its patented advanced multi-zone intelligent thermal control and power management capabilities.
AMPS-BI is a high-power, high-throughput automated burn-in test system for advanced high-power semiconductor devices.
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