M5S
5 Slot Tester
  • Zero Footprint
  • 5 Universal slots
  • Air cooled
  • Environmentally friendly power consumption


Market
Space, Military, Industrial, Sensors

Device
Low digital pin count devices with analog and mixed signal requirements

M5S-HD
5 HD Slot Tester
  • Zero Footprint
  • Up to 1024 pins, 128 A
  • 5 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption


Market
Mobility, Consumer, Computing, Automotive

Device
Medium digital pin count devices, low parallel test

M10S-HD
10 HD Slot Tester
  • Zero Footprint
  • Up to 2048 pins, 256 A
  • 10 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption


Market
Mobility, Consumer, Computing, Automotive

Device
High digital pin count devices and high parallel test requirements. CPU, Chipset, Microcontrollers, Memory

Application Specific
Application Specific Tester
  • Zero Footprint
  • 5-10 Universal high-density slots
  • Application specific instruments
  • Air cooled
  • Environmentally friendly power consumption


Markets
Consumer, application specific

Device
Image Sensors, MIPI interfaces, Application specific

Test that partners innovation is test that powers progress

Our ATE Test Solutions offers a full test solution with Test Systems hardware, software, and support services. With over 40 years of ATE development, our proprietary FPGA-based architecture enables lower Cost of Test for semiconductor manufacturers and vendors.

AEM Mu-Test Evolution

AEM’s ATE solutions for semiconductor IC test scale from Engineering to High Volume Manufacturing for Wafer Sort and Final Test

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2020

FAIRCHILD

Schlumberger

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Mu-Test

Incorporated

Device Characterization

High Volume Manufacturing

AEM ATE

We provide a complete Test Solution that lets our customers develop scalable and cost-effective test solutions that keep up with the market’s rapidly changing needs. The proprietary FPGA-based instruments allow application customization and an open platform capability. Our portfolio of building blocks and leading-edge technology expertise in providing highly customizable and low-cost testing solutions enable us to meet every customer’s needs.

ATE Complete Test Solution

TEST PROGRAMMING
AEM ATE Software
DIAGNOSIS
AEM Test Equipment
AEM Test Equipment
INTERFACING
Component Device Under Test (DUT)
AEM Test Equipment
Handler with DUT
Prober / Handler with DUT
Prober - Wafer Test
Handler - Package Test

Our customized solutions enable you to always be a step ahead.