Market
Space, Military, Industrial, Sensors
Device
Low digital pin count devices with analog and mixed signal requirements
Market
Mobility, Consumer, Computing, Automotive
Device
Medium digital pin count devices, low parallel test
Market
Mobility, Consumer, Computing, Automotive
Device
High digital pin count devices and high parallel test requirements. CPU, Chipset, Microcontrollers, Memory
Markets
Consumer, application specific
Device
Image Sensors, MIPI interfaces, Application specific
Test that partners innovation is test that powers progress
Our ATE Test Solutions offers a full test solution with Test Systems hardware, software, and support services. With over 40 years of ATE development, our proprietary FPGA-based architecture enables lower Cost of Test for semiconductor manufacturers and vendors.
AEM Mu-Test Evolution
AEM’s ATE solutions for semiconductor IC test scale from Engineering to High Volume Manufacturing for Wafer Sort and Final Test
We provide a complete Test Solution that lets our customers develop scalable and cost-effective test solutions that keep up with the market’s rapidly changing needs. The proprietary FPGA-based instruments allow application customization and an open platform capability. Our portfolio of building blocks and leading-edge technology expertise in providing highly customizable and low-cost testing solutions enable us to meet every customer’s needs.
Copyright © 2024 AEM | Terms of Use | Privacy Policy
Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions
Offers a full test solution with Test Systems hardware, software & support.
Offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.
