SOLUTIONS

Innovating
application-specific,
intelligent system
level test and handling solutions

Our test solution ranges from customized semiconductor IC test to wafer level MEMS test serving advanced computing, 5G, AI, Automotive and Industrial IoT markets.

Handling solutions

SLT
Disrupting the test flow with AEM’s SLT+ Offerings and World-Leading Thermals
AFORE
Probing, testing, and stepping in any orientation or during rotation with high positioning accuracy
ATE SOLUTIONS
Application Specific Test Solutions from Engineering to High Volume Manufacturing for Wafer Sort and Final Test
Test & Measurements Solutions
SMART Solutions for SMART Buildings

CONTACT

Customization
is in our DNA.

Talk to us to find out how we can meet your test and innovation requirements.

Technology Pillars

Our expertise in customizing test and handling solutions using our technology pillars as a platform, enables us to meet the fast-changing needs of our customers faced with the challenges of testing heterogeneous and complex devices.

Advanced Automation

Thermal Control

Optical Inspection

Interfacing

Test Solutions

Software Integration

A global footprint with
world-class test and
innovation capabilities

Testing Innovation

Media
Feature

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News
Annoucement

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Blog
Feature

For all our blogs written by AEM’s experts