Handling Solutions

Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions

Test Cell Solutions

Burn-In Solutions

High-power, high-throughput automated burn-in capabilities integrated with high-parallel test platform.

System Level Test Solutions

Test Cell Concept enabling Burn-in, Final Test Lite, and System Level Test on a single platform.

Wafer Test Solutions

Wafer Probing, Frame Probing, Wafer Sort Equipment, MEMS Sensors.

Instrumentation

ATE Solutions

Our ATE Test Solutions offers a full test solution with Test Systems hardware, software, and support services

Precision Cable Test

AEM Precision Cable Test, offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.

Talk to us today

We customize to meet our customers’ application needs.

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