AEM at SEMICON Taiwan 2023

Providing full stack end-to-end capabilities and solutions across the globe

AEM ATE Solutions Logo
Our ATE Test Solutions offers a full test solution with Test Systems hardware, software, and support services. With over 40 years of ATE development, our proprietary FPGA-based architecture enables lower Cost of Test for semiconductor manufacturers and vendors.
  • CIS (CMOS Image Sensor) Test Cell provides the best cost of ownership to our customers
  • High performance and configurable test platform ​
  • Fully Integrated and flexible solution
M5S
5 Slot Tester
  • Zero Footprint
  • 5 Universal slots
  • Air cooled
  • Environmentally friendly power consumption


Market
Space, Military, Industrial, Sensors

Device
Low digital pin count devices with analog and mixed signal requirements

 

M5S-HD
5 HD Slot Tester
  • Zero Footprint
  • Up to 1024 pins, 128 A
  • 5 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device Medium digital pin count devices, low parallel test
M10S-HD
10 HD Slot Tester
  • Zero Footprint
  • Up to 2048 pins, 256 A
  • 10 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device High digital pin count devices and high parallel test requirements. CPU, Chipset, Microcontrollers, Memory
Application Specific
Application Specific Tester
  • Zero Footprint
  • 5-10 Universal high-density slots
  • Application specific instruments
  • Air cooled
  • Environmentally friendly power consumption


Markets
Consumer, application specific

Device
Image Sensors, MIPI interfaces, Application specific

M5S

5 Slot Tester

  • Zero Footprint
  • 5 Universal slots
  • Air cooled
  • Environmentally friendly power consumption


Market
Space, Military, Industrial, Sensors

Device
Low digital pin count devices with analog and mixed signal requirements

 

M5S-HD

5 HD Slot Tester

  • Zero Footprint
  • Up to 1024 pins, 128 A
  • 5 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device Medium digital pin count devices, low parallel test
M10S-HD

10 HD Slot Tester

  • Zero Footprint
  • Up to 2048 pins, 256 A
  • 10 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device High digital pin count devices and high parallel test requirements. CPU, Chipset, Microcontrollers, Memory
Application Specific

Application Specific Tester

  • Zero Footprint
  • 5-10 Universal high-density slots
  • Application specific instruments
  • Air cooled
  • Environmentally friendly power consumption
Markets Consumer, application specific
Device Image Sensors, MIPI interfaces, Application specific

ATE Brochure & Datasheets

Contact Us

Pascal Pierra

Sr VP / General Manager
Instrumentation BU
M: +65 9101 1980
E: pascal.pierra@aem.com.sg

Sam Au

Country Manager
AEM Taiwan
M: +886-917613887
E: sam.au@aem.com.sg

PRODUCTS

Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions

Offers a full test solution with Test Systems hardware, software & support.

Offers innovative cabling and component test solutions designed for Laboratory, Manufacturing, and Field Use applications.