Our ATE Test Solutions offers a full test solution with Test Systems hardware, software, and support services. With over 40 years of ATE development, our proprietary FPGA-based architecture enables lower Cost of Test for semiconductor manufacturers and vendors.
  • CIS (CMOS Image Sensor) Test Cell provides the best cost of ownership to our customers
  • High performance and configurable test platform ​
  • Fully Integrated and flexible solution
M5S
5 Slot Tester
  • Zero Footprint
  • 5 Universal slots
  • Air cooled
  • Environmentally friendly power consumption
Market Space, Military, Industrial, Sensors Device Low digital pin count devices with analog and mixed signal requirements
M5S-HD
5 HD Slot Tester
  • Zero Footprint
  • Up to 1024 pins, 128 A
  • 5 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device Medium digital pin count devices, low parallel test
M10S-HD
10 HD Slot Tester
  • Zero Footprint
  • Up to 2048 pins, 256 A
  • 10 Universal high-density slots
  • Air cooled
  • Environmentally friendly power consumption
Market Mobility, Consumer, Computing, Automotive Device High digital pin count devices and high parallel test requirements. CPU, Chipset, Microcontrollers, Memory
Application Specific
Application Specific Tester
  • Zero Footprint
  • 5-10 Universal high-density slots
  • Application specific instruments
  • Air cooled
  • Environmentally friendly power consumption


Markets
Consumer, application specific

Device
Image Sensors, MIPI interfaces, Application specific

ATE Brochure & Datasheets

Contact Us

Stuart Pearce

Sr Director Field Marketing,
AEM International (USA)
M: +1 408 4068901
E: stuart.pearce@aem.com.sg

Steven Resnik

Account Manager – US
M: 512-983-4000
E: steven.resnik@aem.com.sg